机读格式显示(MARC)

• 000 01078nam 2200253 4500

• 001 0000505825

• 003 CAL

• 005 20050323101600.0

• 008 050323s1990 maua b 101 0 eng d

• 010 __ |a 89063664

• 020 __ |a 0879301779

• 040 __ |a WUL |c WUL

• 090 __ |a TP216-53/A864

• 093 __ |a TP216-53 |2 4

• 099 __ |a CAL 022000408549

• 245 00 |a ATE & instrumentation conference west : |b get ready for the next decade of test : proceedings, Jan. 8-11, 1990, Disneyland Hotel Convention Center, Anaheim, Ca. / |c spronsored by Electronics Test, Circuits Manufacturing, and EOS/ESD Technology magazines; endorsed by The American Society of Test Engineers.

• 260 __ |a Boston : |b Miller Freeman Expositions, |c c1990.

• 300 __ |a xii, 661 p. : |b ill. ; |c 28 cm.

• 504 __ |a Includes bibliographical references and index.

• 650 _0 |a Automatic checkout equipment |v Congresses.

• 710 2_ |a EOS/ESD Technology magazines.

• 710 2_ |a Electronic Test, Circuits Manufacturing.

• 710 2_ |a The American Society of Test Engineers.

• 950 __ |a JHUL |b TP216-53 |c A864