机读格式显示(MARC)

• 000 01252cam a2200373 i 4500

• 001 0000930271

• 003 CAL

• 005 20211028143900.0

• 008 190415s2019 flua b 001 0 eng

• 010 __ |a 2018027858

• 020 __ |a 9781498783613 |q (hardback : alk. paper)

• 040 __ |a DLC |b eng |e rda |c DLC

• 042 __ |a pcc

• 050 00 |a TA417.25 |b .G74 2018

• 082 00 |a 620.1/1272 |2 23

• 090 __ |a O434.1/X11

• 093 __ |a O434.1 |2 5

• 099 __ |a CAL 022019034246

• 245 00 |a X-ray diffraction imaging : |b technology and applications / |c edited by Joel Greenberg, managing editor Krzysztof Iniewski.

• 264 _1 |a Boca Raton : |b Taylor & Francis, CRC Press, |c [2019]

• 300 __ |a xxi, 255 pages : |b illustrations ; |c 24 cm.

• 336 __ |a text |b txt |2 rdacontent

• 337 __ |a unmediated |b n |2 rdamedia

• 338 __ |a volume |b nc |2 rdacarrier

• 490 0_ |a Devices, circuits, and systems

• 504 __ |a Includes bibliographical references and index.

• 650 _0 |a X-ray diffraction imaging.

• 650 _0 |a Radiography, Industrial.

• 650 _0 |a Detectors |x Equipment and supplies.

• 650 _0 |a Refractometers.

• 700 1_ |a Greenberg, Joel |q (Joel Alter), |e editor.

• 700 1_ |a Iniewski, Krzysztof, |d 1960- |e editor.

• 920 __ |a 242450 |z 1

• 998 __ |a XJT