机读格式显示(MARC)
- 000 01151nam a2200337 a 4500
- 008 181119s2018 nyu 001 0 eng d
- 020 __ |a 9789811044328 (pbk.)
- 100 1_ |a Brodusch, Nicolas.
- 245 10 |a Field emission scanning electron microscopy : |b new perspectives for materials characterization / |c Nicolas Brodusch, Hendrix Demers, Raynald Gauvin.
- 260 __ |a New York, NY : |b Springer, |c 2018.
- 300 __ |a xii, 137 p. : |b ill. ; |c 21 cm
- 490 0_ |a SpringerBriefs in applied sciences and technology, |x 2191-530X
- 650 _0 |a Materials |x Testing.
- 650 _0 |a Scanning electron microscopy.
- 650 _0 |a Spectrum analysis.
- 650 _0 |a Materials science.
- 650 _0 |a Nanotechnology.
- 650 _0 |a Materials Science.
- 650 _0 |a Characterization and Evaluation of Materials.
- 650 _0 |a Spectroscopy and Microscopy.
- 650 _0 |a Nanotechnology and Microengineering.
- 700 1_ |a Demers, Hendrix.
- 700 1_ |a Gauvin, Raynald.
- 950 __ |a JHUL |b TB302 |c B864