机读格式显示(MARC)

• 000 01535nam 2200349 4500

• 001 0000504115

• 003 CAL

• 005 20050320140500.0

• 008 050320s1985 gw a b 00100 eng

• 010 __ |a 85062882

• 020 __ |a 0892525924 (pbk.)

• 040 __ |c SJT

• 050 00 |a TS156.2 |b .I56 1985

• 082 0_ |a 681/.2 |2 19

• 090 __ |a TP274-532/B871

• 093 __ |a TP274-532 |2 4

• 099 __ |a CAL 022000310121 |a CAL 021999645372

• 111 2_ |a International Conference on Automatic Inspection and Measurement |d (1985 : |c San Diego, Calif.)

• 245 10 |a International Conference on Automatic Inspection and Measurement : |b August 20-21, 1985, San Diego, California / |c Richard A. Brook, Michael J.W. Chen, chairmen/editors ; cosponsored by Sira Ltd.--the Research Association for Instrumentation ; coopera

• 260 __ |a Bellingham, Wash., USA : |b SPIE--International Society for Optical Engineering, |c c1985.

• 300 __ |a vi, 176 p. : |b ill. ; |c 28 cm.

• 440 _0 |a Proceedings of SPIE--the International Society for Optical Engineering ; |v v. 557

• 504 __ |a Includes bibliographies and index.

• 650 _0 |a Engineering inspection |x Automation |x Congresses.

• 650 _0 |a Quality control |x Optical methods |x Congresses.

• 700 1_ |a Brook, Richard A.

• 700 1_ |a Chen, Michael J. W.

• 710 20 |a Sira Limited.

• 710 20 |a University of Arizona. |b Optical Sciences Center.

• 710 20 |a University of Rochester. |b Institute of Optics.

• 710 20 |a Society of Photo-optical Instrumentation Engineers.

• 950 __ |a JHUL |b TP274-532 |c B871