机读格式显示(MARC)

• 000 01473cas 2200421 a 4500

• 001 0000451970

• 003 CAL

• 005 20041126154300.0

• 008 041126c19879999enkmrzp rai 0 a0eng d

• 010 __ |a 89659560 |z sn 87003558

• 022 0_ |a 0950-4850

• 032 __ |a 099270 |b USPS

• 035 __ |a (OCoLC)17064558

• 040 __ |a NSDP |d PUL |c PUL

• 042 __ |a nsdp |a lc

• 050 00 |a TK7871.85 |b .K43

• 082 00 |a 621.381/52/05 |2 20

• 090 __ |a Z8/W43

• 093 __ |a Z8 |2 4

• 098 __ |a 730C0014-12 |b 6834

• 099 __ |a CAL 121999000558

• 210 0_ |a Key abstr., Semicond. devices

• 222 _0 |a Key abstracts. Semiconductor devices

• 245 00 |a Key abstracts. |p Semiconductor devices.

• 246 10 |a Semiconductor devices

• 260 __ |a Hitchin, Herts., U.K., GBR : |b INSPEC, Institution of Electrical Engineers ; |a New York, N.Y., USA : |b Institute of Electrical and Electronics Engineers, |c 1987-

• 300 __ |a v. ; |c 30 cm.

• 310 __ |a Monthly

• 362 1_ |a Began with No. 1 in 1987.

• 500 __ |a Includes index.

• 500 __ |a Place of U.S. publisher varies: Piscataway, NJ, <Nov. 1988->.

• 500 __ |a Description based on: August 1992; title from cover.

• 650 _0 |a Semiconductors |v Abstracts |v Periodicals.

• 710 2_ |a Institute of Electrical and Electronics Engineers.

• 710 2_ |a INSPEC (Information service)

• 780 01 |t Key abstracts. Solid state devices |x 0306-5537 |w (OCoLC)5811272

• 905 __ |a 242450 |b 0950-4850 |c Z8 |i no. 1 1987- |z 2

• 998 __ |a PUL