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- 000 01377nam 2200301 a 4500
- 008 050319s1987 waua b 001 0 eng
- 020 __ |a 089252765X (pbk.)
- 050 00 |a TS156.2 |b .A89 1987
- 099 __ |a CAL 021999645395 |a CAL 022000314091 |a CAL 021999655007
- 245 10 |a Automated inspection and measurement : |b 28-30 October 1986, Cambridge, Massachusetts / |c Michael J.W. Chen, Robert Thibadeau, chairs/editors ; sponsored by SPIE--the International Society for Optical Engineering ; cooperating organizations, Carnegie Mellon University, Sira Ltd. (United Kingdom), Tufts University/Electro-Optics Technology Center.
- 260 __ |a Bellingham, Wash., USA : |b SPIE--the International Society for Optical Engineering, |c c1987.
- 300 __ |a vi, 256 p. : |b ill. ; |c 28 cm.
- 440 _0 |a Proceedings of SPIE--the International Society for Optical Engineering ; |v v. 730
- 504 __ |a Includes bibliographies and index.
- 650 _0 |a Engineering inspection |x Automation |x Congresses.
- 650 _0 |a Quality control |x Optical methods |x Congresses.
- 700 1_ |a Chen, Michael J. W.
- 700 1_ |a Thibadeau, Robert.
- 710 2_ |a Society of Photo-optical Instrumentation Engineers.
- 950 __ |a JHUL |b TP29 |c A939