机读格式显示(MARC)
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- 100 __ |a 20231011d2023 ekmy0chiy50 ea
- 200 1_ |a 基于机器视觉的芯片缺陷检测技术研究 |A Ji Yu Ji Qi Shi Jue De Xin Pian Que Xian Jian Ce Ji Shu Yan Jiu |d Research on Chip Defect Detection Technology Based on Machine Vision |f 尤世军 |g 指导老师:张建敏
- 215 __ |a 57页 |c 图 |d 29cm
- 328 __ |a 学位论文(硕士)--江汉大学,2023
- 500 10 |a Research on Chip Defect Detection Technology Based on Machine Vision |m chi
- 606 __ |a 计算机技术 |A Ji Suan Ji Ji Shu |j 学位论文
- 701 _0 |a 尤世军 |A You Shi Jun |4 著
- 702 _0 |a 张建敏 |A Zhang Jian Min |4 指导
- 801 _0 |a CN |b JHUD |c 20231102
- 905 __ |a JHUD |d N533:TP3/26