机读格式显示(MARC)

• 000 00945nam a2200289 a 4500

• 001 0000635083

• 003 CAL

• 005 20081125102000.0

• 008 081007r20082007cc a b 001 0 eng d

• 020 __ |a 9787030222596

• 040 __ |a DUTL |c DUTL

• 090 __ |a TB383/A389(C)

• 093 __ |a TB383 |2 4

• 099 __ |a CAL 022008130584

• 100 1_ |a Alford, Terry L.

• 245 10 |a Fundamentals of nanoscale film analysis = |b 纳米薄膜分析基础 / |c T. L. Alford, L. C. Feldman, J. W. Mayer.

• 246 31 |a 纳米薄膜分析基础

• 260 __ |a 北京 : |b 科学出版社, |c 2008.

• 300 __ |a xii, 336 p. : |b ill. ; |c 25 cm.

• 440 _0 |a 国外物理名著系列 ; |v 17

• 504 __ |a Includes bibliographical references and index.

• 534 __ |p Reprint. Originally published: |c New York : Springer, c2007. |z 9780387292601.

• 650 _0 |a Thin films.

• 650 _0 |a Nanostructured materials.

• 700 1_ |a Feldman, Leonard C.

• 700 1_ |a Mayer, James W., |d 1930-

• 950 __ |a JHUL |b TB383 |c A389(C)