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西文图书1.International Conference on Automatic Inspection and Measurement : August 20-21, 1985, San Diego, Ca TP274-532/B871
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可借复本:1 International Conference on Automatic Inspection and Measurement
SPIE--International Society for Optical Engineering, c1985.
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西文图书2.Automated inspection and measurement : 28-30 October 1986, Cambridge, Massachusetts / TP29/A939
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可借复本:1 Michael J.W. Chen, Robert Thibadeau, chairs/editors ; sponsored by SPIE--the International Society f
SPIE--the International Society for Optical Engineering, c1987.
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