江汉大学图书馆书目检索系统

Online Public Access Catalogue

题名/责任者:

Automated inspection and measurement : 28-30 October 1986, Cambridge, Massachusetts / Michael J.W. Chen, Robert Thibadeau, chairs/editors ; sponsored by SPIE--the International Society for Optical Engineering ; cooperating organizations, Carnegie Mellon University, Sira Ltd. (United Kingdom), Tufts University/Electro-Optics Technology Center.

出版发行项:

Bellingham, Wash., USA : SPIE--the International Society for Optical Engineering, c1987.

ISBN:

089252765X (pbk.)

载体形态项:

vi, 256 p. : ill. ; 28 cm.

丛编题名:

Proceedings of SPIE--the International Society for Optical Engineering ; v. 730

附加个人名称:

Chen, Michael J. W.

附加个人名称:

Thibadeau, Robert.

附加团体名称:

Society of Photo-optical Instrumentation Engineers.

论题主题:

Engineering inspection-Automation-Congresses.

论题主题:

Quality control-Optical methods-Congresses.

中图法分类号:

TP29

书目附注:

Includes bibliographies and index.

豆瓣简介：