MARC状态：审校 文献类型：西文图书 浏览次数：42
- 题名/责任者:
- Field emission scanning electron microscopy : new perspectives for materials characterization / Nicolas Brodusch, Hendrix Demers, Raynald Gauvin.
- 出版发行项:
- New York, NY : Springer, 2018.
- ISBN:
- 9789811044328 (pbk.)
- 载体形态项:
- xii, 137 p. : ill. ; 21 cm
- 丛编说明:
- SpringerBriefs in applied sciences and technology, 2191-530X
- 个人责任者:
- Brodusch, Nicolas.
- 附加个人名称:
- Demers, Hendrix.
- 附加个人名称:
- Gauvin, Raynald.
- 论题主题:
- Materials-Testing.
- 论题主题:
- Spectrum analysis.
- 论题主题:
- Materials science.
- 论题主题:
- Microscopy.
- 论题主题:
- Nanotechnology.
- 论题主题:
- Materials Science.
- 中图法分类号:
- TB302
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