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题名/责任者:

ATE & instrumentation conference west : get ready for the next decade of test : proceedings, Jan. 8-11, 1990, Disneyland Hotel Convention Center, Anaheim, Ca. / spronsored by Electronics Test, Circuits Manufacturing, and EOS/ESD Technology magazines; endorsed by The American Society of Test Engineers.

出版发行项:

Boston : Miller Freeman Expositions, c1990.

ISBN:

0879301779

载体形态项:

xii, 661 p. : ill. ; 28 cm.

附加团体名称:

EOS/ESD Technology magazines.

附加团体名称:

Electronic Test, Circuits Manufacturing.

附加团体名称:

The American Society of Test Engineers.

论题主题:

Automatic checkout equipment-Congresses.

中图法分类号:

TP216-53

书目附注:

Includes bibliographical references and index.

豆瓣简介：